发明名称 METHOD FOR ETCHING SEMICONDUCTOR LAYER AND MANUFACTURE OF SEMICONDUCTOR LIGHT EMITTING ELEMENT USING THE SAME
摘要 PROBLEM TO BE SOLVED: To etch a thick semiconductor layer by using a thin etching mask by using an easily-oxidizable metallic film for an etching film and performing the etching while an oxidizing source is supplied for oxidizing the metallic film. SOLUTION: After a Ti film 3 and a photoresist film 4 are successively formed on the surface of a semiconductor layer 2, the part corresponding to the prescribed etching area of the semiconductor layer 2 is opened by patterning (a). Then the prescribed etching part of the semiconductor layer 2 is exposed by etching the Ti film 3 by using the photoresist film 4 as a mask (b). Thereafter, the semiconductor layer 2 is etched by the CAIBE method by using the photoresist film 4 and Ti film 3 as masks while an oxygen gas is supplied. When the oxygen gas is supplied, the exposed surface of the Ti film 3 is oxidized to TiO2 by the oxygen and the Ti film 3 becomes to be hardly etched. Therefore, precise perpendicular etching can be performed easily by improving the patterning accuracy, because the etching mask can be formed in a very thin film.
申请公布号 JPH10321592(A) 申请公布日期 1998.12.04
申请号 JP19970125169 申请日期 1997.05.15
申请人 ROHM CO LTD 发明人 YANO HITOHISA;ICHIHARA ATSUSHI
分类号 H01L21/306;H01L33/32;H01S5/00;H01S5/323 主分类号 H01L21/306
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