发明名称 WAFER-TRANSFER DEVICE WITH WAFER ERRONEOUS MOUNT DETECTION SENSOR, SEMICONDUCTOR-MANUFACTURING DEVICE WITH THE SAME, AND WAFER-TRANSFER METHOD USING THE SAME
摘要 <p>PROBLEM TO BE SOLVED: To provide a wafer-transfer device for detecting an erroneously mounted wafer, a semiconductor-manufacturing device with the device, and a method for transferring wafers using the wafer-carrying device. SOLUTION: A number of photosensors 120 are provided at the vertical position of a wafer diameter where a plurality of wafers 114 are aligned before they are separated from a cassette 116 and are carried into a semiconductor- manufacturing device. Then, a wafer-transfer device 99 is used and the photosensors 120 are operated along the outer-periphery surface of the wafers 114 and light is applied, thus detecting whether the wafers 114 are mounted by mistake.</p>
申请公布号 JPH10321699(A) 申请公布日期 1998.12.04
申请号 JP19980067403 申请日期 1998.03.17
申请人 SAMSUNG ELECTRON CO LTD 发明人 KO RYUIN;BOKU ZAISO;KIN KOSHU;BOKU SAIHAN
分类号 B65G1/00;B65G43/08;B65G49/07;H01L21/66;H01L21/673;H01L21/677;H01L21/68;(IPC1-7):H01L21/68 主分类号 B65G1/00
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