发明名称 TEST SIGNAL INSERTION SYSTEM
摘要 PROBLEM TO BE SOLVED: To operate automatically a test device in response to an entered test signal speed by operating each section of a subscriber terminator based on a detection result of an input speed of the test signal so as to adopt the test device that handles a signal form with the terminal speed. SOLUTION: A test signal speed detection section 53 detects a speed of a test signal received from a test device and informs the result to a speed conversion section 54 that converts the test signal into a main signal and to a speed inverse conversion section 55 that converts the main signal into the test signal. The speed conversion section 54 generates arm inserted test signal 13 and a signal 14 to instruct an assigned time slot and gives them to a test signal insertion section 56. The test signal insertion section 56 inserts the test signal to the assigned time slot and provides an output of the result to a line terminator 59. The main signal looped back at a terminal terminator 60 is branched at a test signal branch section 57 and fed to the speed inverse conversion section 55, which separates the test signal from the assigned time slot according to the informed test signal speed and gives the result to a test signal detection measurement section 52 as a test signal output.
申请公布号 JPH10322417(A) 申请公布日期 1998.12.04
申请号 JP19970143133 申请日期 1997.05.16
申请人 NEC CORP 发明人 MUROI KIYOSHI
分类号 G06F11/22;H04L12/24;H04L12/26;H04L29/14;H04M11/00 主分类号 G06F11/22
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