发明名称 Material testing plant
摘要 Material testing plant has an X-ray source (9-13) which features an oblong anode (9) scanned by an electron beam. The focus (8) of the beam travels along the anode (9) so that the X-ray beam emanating from the focus (8) scans a predetermined path. The beam (5) hits a line detector (6) which comprises a row of detector elements. The output signals of the detector elements are used to determine parameters of the object (1) being tested between the X-ray source and the line detector (6).
申请公布号 DE19722482(A1) 申请公布日期 1998.12.03
申请号 DE19971022482 申请日期 1997.05.28
申请人 SIEMENS AG, 80333 MUENCHEN, DE 发明人 HELL, ERICH, DR., 91054 ERLANGEN, DE;SCHARDT, PETER, DR., 91341 ROETTENBACH, DE
分类号 D21F7/06;G01B15/02;G01B15/04;(IPC1-7):G01N23/16;G01N5/00;G01N23/06 主分类号 D21F7/06
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