发明名称 UV low pass filter
摘要 The low pass filter for use in the UV spectrum comprises a dielectric stack which ensures an anti-reflective function for wavelengths ( lambda ) greater than a critical value ( lambda c). The critical value is less than 300 nm. Beneath these layers there is a metal base layer ensuring a reflection function for wavelengths greater than the critical value of wavelength ( lambda c). The combination formed in this way does not require a very thick dielectric stack - a thickness between a hundred nanometres and several micrometres if sufficient. The metal forming the base may be an alkali metal, or an alkali earth, so that the cut-off wavelength lies within the UV spectrum. One or more layers of material having the required anti-reflective properties may be used, and the layers may alternate with two different materials.
申请公布号 EP0881508(A1) 申请公布日期 1998.12.02
申请号 EP19980401282 申请日期 1998.05.28
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE 发明人 CHATON, PATRICK;DIJON, JEAN
分类号 G02B1/11;G02B5/20;G02B5/28 主分类号 G02B1/11
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