发明名称 |
UV low pass filter |
摘要 |
The low pass filter for use in the UV spectrum comprises a dielectric stack which ensures an anti-reflective function for wavelengths ( lambda ) greater than a critical value ( lambda c). The critical value is less than 300 nm. Beneath these layers there is a metal base layer ensuring a reflection function for wavelengths greater than the critical value of wavelength ( lambda c). The combination formed in this way does not require a very thick dielectric stack - a thickness between a hundred nanometres and several micrometres if sufficient. The metal forming the base may be an alkali metal, or an alkali earth, so that the cut-off wavelength lies within the UV spectrum. One or more layers of material having the required anti-reflective properties may be used, and the layers may alternate with two different materials. |
申请公布号 |
EP0881508(A1) |
申请公布日期 |
1998.12.02 |
申请号 |
EP19980401282 |
申请日期 |
1998.05.28 |
申请人 |
COMMISSARIAT A L'ENERGIE ATOMIQUE |
发明人 |
CHATON, PATRICK;DIJON, JEAN |
分类号 |
G02B1/11;G02B5/20;G02B5/28 |
主分类号 |
G02B1/11 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|