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发明名称
THE IC TEST DEVICE FOR MULTI-CHIP PACKAGE
摘要
申请公布号
KR0146186(B1)
申请公布日期
1998.12.01
申请号
KR19950008985
申请日期
1995.04.17
申请人
SAMSUNG ELECTRONICS CO.,LTD
发明人
JOO, SHIN
分类号
G01R31/26;G01R31/3183;(IPC1-7):G01R31/26
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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