| 发明名称 |
Measuring deposit thickness in composite materials production |
| 摘要 |
This invention relates to novel apparatuses for measuring deposit thickness during composite materials production. More particularly, this invention uses a composite's emission signature or a composite's reflectance signature, to measure deposit thickness.
|
| 申请公布号 |
US5843232(A) |
申请公布日期 |
1998.12.01 |
| 申请号 |
US19950554323 |
申请日期 |
1995.11.02 |
| 申请人 |
GENERAL ELECTRIC COMPANY |
发明人 |
SAVKAR, SUDHIR DATTATRAYA;LILLQUIST, ROBERT DAVID;MILLER, RUSSELL SCOTT |
| 分类号 |
C23C4/12;G01B11/06;(IPC1-7):C23C4/00 |
主分类号 |
C23C4/12 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
|
| 地址 |
|
