发明名称 Device for protecting a semiconductor circuit
摘要 A protection device for protecting a semiconductor circuit from positive and negative overvoltage such as static electrical discharges. A p-type substrate is provided having a pair of spaced apart n-type regions formed therein. Each of the spaced apart n-type regions has a p+ region and an n+ region formed therein. Each of the spaced apart n-type regions also includes an n+ drain tap which has a portion in contact with the substrate. The n+ region and one p+ region of one of the spaced apart n-type regions are connected to a terminal of a semiconductor circuit. The n+ region and p+ regions of the other n-type region are connected to a power voltage of the semiconductor device. A insulated gate is formed on a p-type semiconductor substrate, and is in contact with both n+ drain taps. The gate is grounded. The bilateral protection device of the present invention protects the semiconductor circuit against positive and negative overvoltages.
申请公布号 US5844280(A) 申请公布日期 1998.12.01
申请号 US19960774618 申请日期 1996.12.30
申请人 SAMSUNG ELECTRONICS, CO., LTD. 发明人 KIM, DAE-KYU
分类号 H01L27/04;H01L21/822;H01L27/02;H01L27/06;(IPC1-7):H01L23/62 主分类号 H01L27/04
代理机构 代理人
主权项
地址