发明名称 |
Device for protecting a semiconductor circuit |
摘要 |
A protection device for protecting a semiconductor circuit from positive and negative overvoltage such as static electrical discharges. A p-type substrate is provided having a pair of spaced apart n-type regions formed therein. Each of the spaced apart n-type regions has a p+ region and an n+ region formed therein. Each of the spaced apart n-type regions also includes an n+ drain tap which has a portion in contact with the substrate. The n+ region and one p+ region of one of the spaced apart n-type regions are connected to a terminal of a semiconductor circuit. The n+ region and p+ regions of the other n-type region are connected to a power voltage of the semiconductor device. A insulated gate is formed on a p-type semiconductor substrate, and is in contact with both n+ drain taps. The gate is grounded. The bilateral protection device of the present invention protects the semiconductor circuit against positive and negative overvoltages.
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申请公布号 |
US5844280(A) |
申请公布日期 |
1998.12.01 |
申请号 |
US19960774618 |
申请日期 |
1996.12.30 |
申请人 |
SAMSUNG ELECTRONICS, CO., LTD. |
发明人 |
KIM, DAE-KYU |
分类号 |
H01L27/04;H01L21/822;H01L27/02;H01L27/06;(IPC1-7):H01L23/62 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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