发明名称 Memory cell having increased capacitance via a local interconnect to gate capacitor and a method for making such a cell
摘要 A static random access memory (SRAM) cell having increased cell capacitance at the storage nodes utilizes a capacitive structure. The capacitive structure includes a dielectric material between polysilicon conductive lines and tungsten local interconnects. The polysilicon plates are each connected to drains of lateral transistors associated with the SRAM cell. A dielectric material such as silicon dioxide may be deposited between the local interconnect and polysilicon conductive lines. The capacitor structures are provided between first and second N-channel pull down transistors associated with the SRAM cell.
申请公布号 US5844836(A) 申请公布日期 1998.12.01
申请号 US19970822518 申请日期 1997.03.24
申请人 ADVANCED MICRO DEVICES, INC. 发明人 KEPLER, NICHOLAS JOHN;SELCUK, ASIM A.;KLEIN, RICHARD K.;SANDER, CRAIG S.;HOLST, JOHN C.;SPENCE, CHRISTOPHER A.;LEE, RAYMOND T.;HORNE, STEPHEN C.
分类号 G11C11/412;H01L21/8244;H01L27/11;(IPC1-7):G11C11/00 主分类号 G11C11/412
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