发明名称 DISPOSITIF DE MESURE D'EXPOSITION D'UN DETECTEUR D'IMAGE A L'ETAT SOLIDE SOUMIS A UN RAYONNEMENT IONISANT ET DETECTEUR D'IMAGE EQUIPE D'UN TEL DISPOSITIF DE MESURE
摘要 The invention concerns a device for measuring exposure of a solid state image sensor (1). Said detector (1) comprises a first surface (1a) exposed to an ionising radiation (R1) representing the image. It releases through another surface (1b) opposite the first (1a) an unabsorbed ionising radiation (R2). The measuring device is designed to be placed near the other surface and to be exposed to the unabsorbed ionising radiation (R2). It comprises at least one optical fibre (11) emitting a visible or nearly visible radiation, obtained by conversion in the optical fibre, towards at least a sensing device (13), the visible or nearly visible radiation representing the unabsorbed ionising radiation. The sensing device (13) generates a signal representing the image sensor exposure. The invention is in particular applicable to X-ray image sensors.
申请公布号 FR2763700(A1) 申请公布日期 1998.11.27
申请号 FR19970006331 申请日期 1997.05.23
申请人 THOMSON TUBES ELECTRONIQUES 发明人 MOY JEAN PIERRE
分类号 G01T1/00;G01T1/20;G01T5/08;H04N5/32;(IPC1-7):G01T1/10;G03B42/02 主分类号 G01T1/00
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