发明名称 MARKING POSITION CONTROLLER FOR LASER MARKER
摘要 <p>A marking position controller in a laser marker to improve the quality of marks. When blocks into which the mark pattern is vertically divided are displayed successively on a liquid crystal mask to mark each block, the marking position control is made so that a marking position of transmission laser beam when a specified block is scanned and a marking position of transmission laser beam when the next block adjoining the specified block is scanned overlap each other. In another invention, a display pattern is generated which has unmarked areas extending upwardly and downwardly from the mark pattern and the display pattern is divided into a plurality of blocks so that the adjoining upper and lower blocks have their marked areas overlap each other. The overlapping marked areas of the plurality of divided blocks are engraved in the same location on a work, thus engraving the marked area of the mark pattern on the work.</p>
申请公布号 WO1998052714(P1) 申请公布日期 1998.11.26
申请号 JP1998002235 申请日期 1998.05.21
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