摘要 |
The invention relates to a measurement and test method and two testing device for EMV measurements, particularly for electromagnetic field radiation and irradiation with electronic and electrical apparatus and systems. In addition to permitting EMV measurements and tests which can be correlated with other standardized measurement procedures, said method and device also make it possible to carry out highly precise field calibrations. Said method is characterized in that an electromagnetic field is guided between the inner conductors at maximum energy concentrations, and that the flow of electricity from the inner conductors across the screen is largely suppressed and the polarisation of the TEM waveguide can be adjusted. The first device is configured in such a way that at least two inner conductors (6) situated opposite each other and having a flared shape are symmetrically fed at their tip (6a) via a balun (7) and that the inner conductors (6) are connected in an electrically conductive manner via resistors (1) to a first rear wall (3a) and/or a second rear wall (3b). The second device provided for by the invention has at least four inner conductors having a flared shape which are arranged in such a way that symmetrical, pair-by-pair feeding to the tips of the inner conductors forms pairs which, at their ends, are individually sealed against an absorber-covered, conductive rear wall so as to have the correct impedance.
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申请人 |
EURO EMC SERVICE DR. HANSEN GMBH, 14513 TELTOW, DE |
发明人 |
FUNCK, JOERG, DIPL.-ING., 13353 BERLIN, DE;HANSEN, DIETHARD, DR.-ING., BERIKON, CH;RISTAU, DETLEF, DR.-ING.HABIL., 12435 BERLIN, DE |