发明名称 A carrier head with a substrate detection mechanism for a chemical mechanical polishing system
摘要 A carrier head (100) for a chemical mechanical polishing system includes a substrate sensing mechanism. The carrier head includes a base and a flexible member (118) connected to the base to define a chamber (200). A lower surface of the flexible member (118) provides a substrate receiving surface (274). The substrate sensing mechanism includes a sensor to measure a pressure in the chamber (200) and generate an output signal representative thereof, and a processor configured to indicate whether the substrate is attached to the substrate receiving surface (274) in response to the output signal.
申请公布号 EP0879678(A1) 申请公布日期 1998.11.25
申请号 EP19980109369 申请日期 1998.05.22
申请人 APPLIED MATERIALS, INC. 发明人 BORIS, GOUZMAN;SOMEKH, SASSON;ZUNIGA, STEVEN;CHEN, HUNG
分类号 B24B37/005;B24B37/30;H01L21/304 主分类号 B24B37/005
代理机构 代理人
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