| 摘要 |
PCT No. PCT/GB95/01642 Sec. 371 Date Jan. 13, 1997 Sec. 102(e) Date Jan. 13, 1997 PCT Filed Jul. 12, 1995 PCT Pub. No. WO96/02917 PCT Pub. Date Feb. 1, 1996A method of testing a memory associated with a microprocessor, particularly for use in smart cards. The method involves comparing the output from the memory (2) passed along a read path (10) with predetermined data signals generated externally and passed via a port (7) along a read path (9). Comparison is carried out in a comparison device (3) which may, for example, be the microprocessor, suitably programmed. The output form the comparison device (3) is a simple pass/fail verification signal applied to a port (5). The stored data held in memory (2) may be permanently held data such as in a ROM, or (where the memory is alterable) may be specially written to the memory for the purpose of the text.
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