发明名称 |
Charge pump circuit for a semiconductor memory device |
摘要 |
A charge pump circuit of a semiconductor memory device provides high efficiency. A high voltage detector outputs a high voltage detection signal. A regulator outputs a high level and a controller is triggered at a descent edge of a row access strobe bar signal and outputs a high level row access strobe bar pulse signal. An oscillator generates an oscillation pulse signal in accordance with the high level turn-on signal outputted from the regulator. A charge pump performs a pumping operation until the oscillation pulse signal reaches a potential of (Vdd+2Vt) when the oscillation pulse signal is applied thereto, and halts the pumping operation when the high level high voltage detection signal is applied. A pull-up transistor precharges the raised voltage Vpp to a potential of (Vdd-Vt) when power is turned on. The circuit enables a charge pump to have a double booster and a pumping capacitor, thereby satisfying a fast charge supply at a low level voltage and to supply an appropriate amount of charge at a high level voltage.
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申请公布号 |
US5841725(A) |
申请公布日期 |
1998.11.24 |
申请号 |
US19970918667 |
申请日期 |
1997.08.28 |
申请人 |
LG SEMICON CO., LTD. |
发明人 |
KANG, CHANG-MAN;JUN, YOUNG-HYUN |
分类号 |
G11C16/06;G05F3/26;G11C5/14;H02M3/07;(IPC1-7):G11C5/14 |
主分类号 |
G11C16/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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