发明名称 Charge pump circuit for a semiconductor memory device
摘要 A charge pump circuit of a semiconductor memory device provides high efficiency. A high voltage detector outputs a high voltage detection signal. A regulator outputs a high level and a controller is triggered at a descent edge of a row access strobe bar signal and outputs a high level row access strobe bar pulse signal. An oscillator generates an oscillation pulse signal in accordance with the high level turn-on signal outputted from the regulator. A charge pump performs a pumping operation until the oscillation pulse signal reaches a potential of (Vdd+2Vt) when the oscillation pulse signal is applied thereto, and halts the pumping operation when the high level high voltage detection signal is applied. A pull-up transistor precharges the raised voltage Vpp to a potential of (Vdd-Vt) when power is turned on. The circuit enables a charge pump to have a double booster and a pumping capacitor, thereby satisfying a fast charge supply at a low level voltage and to supply an appropriate amount of charge at a high level voltage.
申请公布号 US5841725(A) 申请公布日期 1998.11.24
申请号 US19970918667 申请日期 1997.08.28
申请人 LG SEMICON CO., LTD. 发明人 KANG, CHANG-MAN;JUN, YOUNG-HYUN
分类号 G11C16/06;G05F3/26;G11C5/14;H02M3/07;(IPC1-7):G11C5/14 主分类号 G11C16/06
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