| 摘要 |
PROBLEM TO BE SOLVED: To test a digital circuit without using any special circuit device, etc. SOLUTION: Input information of this invention is generated having specific unit bit width, e.g. (m)-bit width. Its (m)-bit test header 1 is determined and provided with test control information 2. An LSI, a digital circuit board, etc., as a body to be tested, therefore, performs specific synchronization by deciding the (m)-bit test header 1 and performs control for a test corresponding to the contents of the test control information 2 of the test header 1. Further, information on the length of, for example, following information 3 or the test control information 2 itself can be included in this test header 1. Consequently, the length of, for example, the test control information 2 and test information 3 can optionally be determined. The total length of the test control information 2 and test information 3, however, is an integral (n) multiple (=m×n bits) of, for example, the (m) bits. |
