发明名称 PROCESS MEASURING RADIATION FLUX
摘要 FIELD: measurement technology, manufacture of photometric and radiometric dives of various assignment incorporating photodetectors based on photoresistors. SUBSTANCE: process measuring radiation flux involves feed of supply voltage to circuit switching on photoresistor and recording signal proportional to radiation flux, evaluation of minimum value of resistance of illuminated photoresistor, feed of bias voltage to it depending on permissible value of dissipated electric power. Bias voltage is maintained constant in process of action of legitimate or background radiation on pad of photoresistor. EFFECT: linearization of light characteristic of photoresistor and increased accuracy of measurements in wide range of level of recorded signal and background noises. 2 dwgs
申请公布号 RU2122185(C1) 申请公布日期 1998.11.20
申请号 RU19960117338 申请日期 1996.08.23
申请人 NAUCHNO-ISSLEDOVATEL'SKIJ INSTITUT KOMPLEKSNYKH ISPYTANIJ OPTIKO-EHLEKTRONNYKH PRIBOROV I SISTEM VNT;NI SKIJ I KOMPLEKSNYKH ISPYTAN 发明人 STARCHENKO A.N.
分类号 G01J1/44;(IPC1-7):G01J1/44 主分类号 G01J1/44
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