发明名称 STRUTTURA DI UN DISPOSITIVO DI MEMORIA A SEMICONDUTTORE NON VOLATILE
摘要 A nonvolatile semiconductor memory device structure having a matrix of memory cells in a semiconductor material layer. The memory cells are located at intersections of rows and columns of the matrix. Each memory cell includes a control gate electrode connected to one of the rows, a first electrode connected to one of the columns and a second electrode. The rows comprise polysilicon strips extending parallel to each other in a first direction, and the columns are formed by metal strips extending parallel to each other in a second direction orthogonal to the first direction. Short-circuit metal strips are coupled for short-circuiting the second electrodes of the memory cells. The columns and the short-circuit strips arc respectively formed in a first metal level and a second metal level superimposed on each other and electrically insulated by a dielectric layer.
申请公布号 ITMI971167(A1) 申请公布日期 1998.11.20
申请号 IT1997MI01167 申请日期 1997.05.20
申请人 SGS-THOMSON MICROELECTRONICS S.R.L 发明人 ZATELLI NICOLA;PIO FEDERICO;VAJANA BRUNO
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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