发明名称 Optical characteristic and material layer thickness determination method
摘要 The method involves irradiating polarized light on a sample to be examined, and measuring the polarization difference in the light reflected from the sample. A multifrequency calibration measurement is performed before the actual measurement on the sample, whereby the frequency dependency of the attenuation constant and the phase shift are determined and evaluated. After the calibration, the frequency of a rotating optical component is measured for each rotation and the measured intensity of the reflected ray of light is subsequently corrected through modulation with the rotation frequency of the optical component.
申请公布号 DE19721043(A1) 申请公布日期 1998.11.19
申请号 DE19971021043 申请日期 1997.05.09
申请人 FORSCHUNGSVERBUND BERLIN E.V., 12489 BERLIN, DE 发明人 ZETTLER, JOERG-THOMAS, DIPL.-PHYS. DR., 13187 BERLIN, DE;WETHKAMP, THORSTEN, 13629 BERLIN, DE;TREPK, THOMAS, 12169 BERLIN, DE
分类号 G01B11/06;(IPC1-7):G01N21/21;G01D5/36;G01J4/00;G01J4/04;G01N21/55 主分类号 G01B11/06
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