| 摘要 |
<p>In a failure diagnosing apparatus for a semiconductor integrated circuit device as a test circuit device (106), an operation of a test circuit device is simulated using a set of test vectors to produce a simulation result. The test circuit device is tested using the set of test vectors to produce a test result. Next, a first set of combinations of circuit elements is defined based on a circuit data of the test circuit device. In this case, the test circuit device is composed of the circuit elements. A final set of failure candidates is estimated from the first set of combinations based on the simulation result and the test result for each of the test vectors. Then, the final set of failure candidates is outputted. <IMAGE></p> |
