| 摘要 |
There is provided a semiconductor device including a lower wiring layer including a first layer containing aluminum therein and a second layer formed on the first layer, the second layer having an extended portion extending beyond an outer surface of the first layer, an interlayer insulating layer formed covering the lower wiring layer therewith, the interlayer insulating layer being formed with a hole including a first portion terminating at an upper surface of the second layer and a second portion passing the second layer but not reaching a bottom of the first layer, an electrically conductive material filling the hole therewith, and an upper wiring layer formed on the interlayer insulating film in electrical connection with the lower wiring layer through the electrically conductive material. The first layer is not exposed to the second portion of the hole because of the interlayer insulating layer existing under the extended portion of the second layer. Hence, it is possible to prevent aluminum contained in the first layer from being eroded during CVD carried out for forming a contact plug filling the hole therewith. |
