发明名称 METHOD AND APPARATUS FOR SURFACE INSPECTION
摘要 PROBLEM TO BE SOLVED: To obtain a method and an apparatus in which the existance and the shape of an uneven part can be measured with good accuracy and in which a wide range can be measured at one time by a method wherein reflected light in a region to be measured is image-formed by an object-side telecentric optical system, luminance data is acquired and processed and a bright part and a dark part are recognized. SOLUTION: A light irradiation means 110 is constituted of a light source 111, of an aperture 112, of a semitransparent mirror 113 and of a collimating lens 114. An object-side telecentric optical system 300 is provided with an image-formation lens system 320, with a light limitation means 310 such as an aperture diaphragm or an aperture and with an aperture-angle variable means 330. When illumination light is a nearly complete parallel luminous flux and when the aperture diameter of the light limitation means 310 is very small, an image which is formed by the object-side telecentric optical system 300 becomes a bright and dark two-gradation image according to an incidence angle in every point in a region to be measured. An imaging part 400 images the formed image, and luminance data on every point in every pixel, i.e., the region to be measured is acquired. A processing part 510 finds the existence of an uneven part and the shape of the uneven part in the region, to be measured, on the basis of the luminance data.
申请公布号 JPH10307011(A) 申请公布日期 1998.11.17
申请号 JP19960278414 申请日期 1996.10.21
申请人 NEW KURIEISHIYON:KK 发明人 HAGA KAZUMI;SAKAI MOTOYUKI
分类号 G01B11/30;G01N21/88;G01N21/956;G06T1/00;G06T7/60 主分类号 G01B11/30
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