发明名称 Semiconductor device having internal wire and method of fabricating the same
摘要 In order to obtain a semiconductor device having an internal wire of low resistance, a conductive layer whose surface is silicified is provided in a surface of a semiconductor substrate. A conductor whose surface is silicified is provided on the semiconductor substrate in proximity to the conductive layer. This semiconductor device is provided with an internal wiring layer, which is formed by a titanium film and a titanium silicide layer for electrically connecting the surface of the conductive layer and a surface of an end of the conductor with each other, to cover a side wall surface and a bottom surface of a contact hole.
申请公布号 US5837606(A) 申请公布日期 1998.11.17
申请号 US19960668012 申请日期 1996.06.17
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 YAMAGUCHI, TAKEHISA;ODA, HIDEKAZU
分类号 H01L21/3205;H01L21/768;H01L21/8244;H01L23/52;H01L23/522;H01L23/532;H01L27/11;(IPC1-7):H01L21/476 主分类号 H01L21/3205
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