发明名称 Method of forming a cadmium telluride/silicon structure
摘要 In one embodiment, a semiconductor structure is disclosed. The structure includes both a silicon and a cadmium telluride layer. Each may have a (100) lattice orientation. A plurality of buffer layers are disposed between the silicon layer and the cadmium telluride layer. Each of these buffer layers has a lattice constant which is greater than the lattice constant of the layer below it and less than the lattice constant of the layer above it. As examples, these buffer layers may comprise zinc sulfide, zinc selenide, zinc telluride or zinc tellurium selenide.
申请公布号 US5838053(A) 申请公布日期 1998.11.17
申请号 US19960724267 申请日期 1996.09.19
申请人 RAYTHEON TI SYSTEMS, INC. 发明人 BEVAN, MALCOLM J.;SHIH, HUNG-DAH
分类号 H01L31/103;H01L31/18;(IPC1-7):H01L31/00;H01L31/032;H01L31/033;H01L31/072 主分类号 H01L31/103
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