| 摘要 |
A system and method for extracting custom debug signals from an integrated circuit chip. The custom debug signals, which are normally extracted via bonded custom debug pads during the testing of the chip, are made available in production chips, where the custom debug pads are not bonded and therefore unavailable, via the external I/O bus of the integrated circuit. In a preferred embodiment, the integrated circuit operates normally to drive standard debug data from internal nodes of the integrated circuit onto the I/O bus during idles cycles in the normal operation of the integrated circuit. Selection means may be set to drive the custom debug signals onto the I/O bus during idle cycles of normal integrated circuit operation rather than the standard debug data.
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