发明名称 METHOD FOR PRODUCING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To suppress the growth of crystalized layer and to efficiently form ruggedness on the surface of amorphous silicon. SOLUTION: Heat treatment at a 1st temperature is executed to an amorphous silicon stack 3, and a nucleus 4 is formed on the surface of amorphous silicon stack 3 by irradiating a material to become a rugged nucleus. Then, by exposing the amorphous silicon stack 3 forming the nucleus 4 under plasma while executing heat treatment at a 2nd temperature lower than the 1st temperature, hemi-spherical-grains(HSG) 7 are formed on the surface of amorphous silicon stack 3.
申请公布号 JPH10303380(A) 申请公布日期 1998.11.13
申请号 JP19970105805 申请日期 1997.04.23
申请人 NEC CORP 发明人 YAMAMOTO ICHIRO
分类号 H01L27/108;H01L21/02;H01L21/8242;H01L29/423 主分类号 H01L27/108
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