发明名称 PROBE CONTACT PIN STROKE MEASURING METHOD FOR IC TESTER
摘要 PROBLEM TO BE SOLVED: To improve the measuring precision and prevent dirt from depositing on the contact in measurement. SOLUTION: A measuring contact pin 21 has an outer cylinder 21a with its outline equal to that of the outer cylinder of a probe contact pin 8 and a movable contact 21b fitted and held to the inner face thereof. The movable contact 21b with its projecting length La from the outer cylinder 21a, when separating from the other member is equal to the projecting length of the movable contact of the probe contact pin 8 and, when pushed in the outer cylinder 21a with outer force, it is held as it is located even after the outer force is removed. In measurement, the measuring contact pin 21 instead of the probe contact pin 8 is part of a test head is inserted therein and the test head 6 is put in contact with a wafer prober 5 or a handler 12 in the same way as in real test and then pulled off to measure a distanceΔL in the projecting direction between the end of the probe contact pin 8 and the end of the measuring contact pin 21 for stroke operation.
申请公布号 JPH10300822(A) 申请公布日期 1998.11.13
申请号 JP19970110562 申请日期 1997.04.28
申请人 ADVANTEST CORP 发明人 NAMIKI KATSUHIKO
分类号 G01R31/26;G01R1/06;G01R31/28;H01L21/66;(IPC1-7):G01R31/28 主分类号 G01R31/26
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