发明名称 |
Breakdown-tiggered transient discharge circuit |
摘要 |
An arrangement for preventing damage to a circuit of an integrated circuit due to the occurrence of voltage transients introduced externally to the integrated circuit. Generally, the arrangement provides protection against voltage transients for certain circumstances and disables such protection for other circumstances. Transient protection is enabled when the power of the transient would cause breakdown of the transistors of the integrated circuit. Otherwise, transient protection is disabled.
|
申请公布号 |
US5835328(A) |
申请公布日期 |
1998.11.10 |
申请号 |
US19970914290 |
申请日期 |
1997.08.18 |
申请人 |
INTEL CORPORATION |
发明人 |
MALONEY, TIMOTHY J.;PARAT, KRISHNA |
分类号 |
H02H9/04;(IPC1-7):H02H3/22 |
主分类号 |
H02H9/04 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|