| 摘要 |
A test probe guide device 10 for use with a conventional electrical test probe 100 and an electrical wire 200 wherein the guide device 10 includes a housing member 20 dimensioned to receive the test probe 100 and spring biased plunger disk 30 and further including a wire engaging unit 13 comprising a hook member 40 dimensioned to captively engage the electrical wire 200 to allow the test probe needle 102 to be electrically connected to the electrical wire 200.
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