发明名称 |
Special test modes for a page buffer shared resource in a memory device |
摘要 |
A flash memory device having a page buffer circuit with special testing modes. The page buffer circuit comprises a plane A and a plane B, each comprising a static random access memory array. The page buffer circuit further comprises a mode control circuit that maps the plane A and the plane B as a contiguous extended memory space accessible over a host bus. The page buffer circuit also maps the plane A and the plane B as a control store for a flash array controller of the flash memory device. |
申请公布号 |
US5835927(A) |
申请公布日期 |
1998.11.10 |
申请号 |
US19960719583 |
申请日期 |
1996.09.25 |
申请人 |
INTEL CORPORATION |
发明人 |
FANDRICH, MICKEY L.;FEDEL, SALIM B.;ALEXIS, RANJEET;RASHID, MAMUN |
分类号 |
G01R31/3185;G06F11/22;G06F12/02;G11C11/00;G11C16/10;G11C29/26;G11C29/48;(IPC1-7):G06F12/00 |
主分类号 |
G01R31/3185 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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