发明名称 SEMICONDUCTOR WAFER POLISHING DEVICE AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide a machine and method to chemically and mechanically polish(CMP) semiconductor wafers. SOLUTION: At least one polishing device is provided with a polishing pad polishing face, which can be rotated and is perpendicularly oriented, and a slurry supply mechanism 20. A semiconductor wafer is provided so that it is received by a wafer carrier 40 from a holder/cassette and can be held contacting the polishing area 2 of the polishing pad in parallel with each other. A conditioning module 30 securing a spring 31 can be provided in the area next to the polishing area 2 to clean/condition the polishing pad. In this case, slurry drops through an exit 26 from a slurry conduit 24 and uniformly expanded by a squeeze 22. In such constitution. The floor space for machine installation is substantially reduced, as a result, the prevention of sticking of pollutants to the polishing machine can be promoted.
申请公布号 JPH10296618(A) 申请公布日期 1998.11.10
申请号 JP19980109008 申请日期 1998.04.20
申请人 INTERNATL BUSINESS MACH CORP <IBM> 发明人 MATTHEW KIRKPATRICK MILLER;MATTHEW JEREMY RUTON;WRIGHT TERRANCE M
分类号 B24B37/10;H01L21/304 主分类号 B24B37/10
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