发明名称 METHOD FOR INSPECTING LIQUID CRYSTAL DISPLAY DEVICE
摘要 PROBLEM TO BE SOLVED: To securely find a black-and-white inversion point defect which possibly becomes latent with time only through easy operation in the manufacturing stage of the liquid crystal display device. SOLUTION: For the inspecting method for inspecting whether or not pixels constituting the display surface V of the liquid crystal display device 17 equipped with an active element 13 have a defect, the entire display surface V is displayed with uniform lightness by controlling the illumination of each pixel by using a driver IC 18 and the display surface V is observed obliquely at an angleθ. Although a laser correction white dot and a black-and-white inversion defect can not be discriminated through an observation from the right- angled R direction, the both can be discriminated through the oblique observation.
申请公布号 JPH10293282(A) 申请公布日期 1998.11.04
申请号 JP19970102294 申请日期 1997.04.18
申请人 SEIKO EPSON CORP 发明人 KAWASHIMA TOSHINAO
分类号 G01R31/00;G02F1/13;(IPC1-7):G02F1/13 主分类号 G01R31/00
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