发明名称 SINGLE-WAFER BASIS SPUTTERING DEVICE
摘要 PROBLEM TO BE SOLVED: To set an angle formed by an orientation flat and an axis of easy magnetization of a magnetic film at a desired value by unloading a wafer inside a cassette which is rotated by a specified angle and mounting a wafer on a wafer stage so that a contact inner wall surface of a cassette and an orientation flat form a specified angle. SOLUTION: A cassette is held in a specified direction. That is, when a wafer is mounted on a wafer stage by a robot, it is held in a direction wherein an angle formed by an orientation flat and an applied magnetic field direction becomes 0 deg.. Then, a cassette is rotated by a specified angleθaround a wafer central axis 19 inside a cassette and stopped by a cassette stage 25. Then, a wafer 18 is mounted on an arm by a robot and is unloaded, and mounted on a wafer stage of a sputter chamber. Thereby, a wafer is mounted on a wafer stage so that an angle formed by an orientation flat 17 of the wafer 18 and an applied magnetic field direction becomesθ.
申请公布号 JPH10294282(A) 申请公布日期 1998.11.04
申请号 JP19970102919 申请日期 1997.04.21
申请人 SONY CORP 发明人 ABE MORIAKI;TAKADA AKIO
分类号 C23C14/34;C23C14/50;H01L21/203;H01L43/12;(IPC1-7):H01L21/203 主分类号 C23C14/34
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