发明名称 METHOD AND APPARATUS FOR CONTROL OF FACE POSITION OF SUBSTRATE AS WELL AS METHOD AND APPARATUS FOR EXPOSURE
摘要 PROBLEM TO BE SOLVED: To perform a focusing adjustment and a leveling adjustment precisely to a chipped shot which is situated in the peripheral part of a photosensitive substrate. SOLUTION: When a shot region capable of measuring all focus measuring points is exposed, focus values of respective focus measuring points P11 , P12 , P13 ,... after the finish of a focusing adjustment and of a leveling adjustment are stored as offset values. Then, with reference to a chipped shot 13B, an approximate plane LC is found in such a way that focus values in the measurable focus measuring points P11 to P23 become the same value as a stored focus value, and a focusing adjustment and a leveling adjustment are performed in such a way that the approximate plane LC agrees with a reference face (a best focus face in a projection optical system).
申请公布号 JPH10294257(A) 申请公布日期 1998.11.04
申请号 JP19970100614 申请日期 1997.04.17
申请人 NIKON CORP 发明人 SUGIMOTO MUNETAKE
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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