发明名称 |
Selective patterning of metallization on a dielectric substrate |
摘要 |
A method of selectively fabricating metallization on a dielectric substrate is disclosed. A seed layer is sputtered on a polymer dielectric, a patterned photoresist mask is disposed over the seed layer, exposed portions of the seed layer are etched, the photoresist is stripped, and copper is deposited without a mask by electroless plating on the unetched seed layer to form well-adhering high density copper lines without exposing the photoresist to the electroless bath.
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申请公布号 |
US5830533(A) |
申请公布日期 |
1998.11.03 |
申请号 |
US19920985663 |
申请日期 |
1992.12.04 |
申请人 |
MICROELECTRONICS AND COMPUTER TECHNOLOGY CORPORATION |
发明人 |
LIN, CHARLES W. C.;GERMAN, RANDY L. |
分类号 |
H05K3/18;(IPC1-7):B05D1/32 |
主分类号 |
H05K3/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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