发明名称 Selective patterning of metallization on a dielectric substrate
摘要 A method of selectively fabricating metallization on a dielectric substrate is disclosed. A seed layer is sputtered on a polymer dielectric, a patterned photoresist mask is disposed over the seed layer, exposed portions of the seed layer are etched, the photoresist is stripped, and copper is deposited without a mask by electroless plating on the unetched seed layer to form well-adhering high density copper lines without exposing the photoresist to the electroless bath.
申请公布号 US5830533(A) 申请公布日期 1998.11.03
申请号 US19920985663 申请日期 1992.12.04
申请人 MICROELECTRONICS AND COMPUTER TECHNOLOGY CORPORATION 发明人 LIN, CHARLES W. C.;GERMAN, RANDY L.
分类号 H05K3/18;(IPC1-7):B05D1/32 主分类号 H05K3/18
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