| 发明名称 |
Circuit and method for varying a period of an internal control signal during a test mode |
| 摘要 |
The invention is a dynamic random access memory (DRAM) device having an electronic test key fabricated on board and is a method for testing the DRAM. The electronic test key generates a signal which effects a variation in a period of an internal control signal to stress the DRAM during a test mode.
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| 申请公布号 |
US5831918(A) |
申请公布日期 |
1998.11.03 |
| 申请号 |
US19960663939 |
申请日期 |
1996.06.14 |
| 申请人 |
MICRON TECHNOLOGY, INC. |
发明人 |
MERRITT, TODD A.;ZAGAR, PAUL S. |
| 分类号 |
G11C29/02;G11C29/50;(IPC1-7):G11C29/00 |
主分类号 |
G11C29/02 |
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