发明名称 X-ray examination apparatus
摘要 An X-ray examination apparatus includes an X-ray diagnosis apparatus (first imaging area), an X-ray CT apparatus (second imaging area), a bed, and the X-ray diagnosis apparatus and the X-ray CT apparatus are arranged along a path of movement of a top plate of the bed in such a manner that the first and second imaging areas are spaced a predetermined distance from each other in a path of movement of the top plate. There is provided a top plate reciprocal movement control means which through operations of switches moves the top plate forward and backward between a first top plate position where a desired part of the patient is positioned at the first imaging area and a second top plate position where the top plate is spaced from the first top plate position toward the X-ray CT apparatus by a distance corresponding to the distance between the first and second imaging areas so that in the reciprocal movement of the two apparatuses, the top plate can be stopped at the first and second top plate position.
申请公布号 US5832056(A) 申请公布日期 1998.11.03
申请号 US19960716545 申请日期 1996.09.19
申请人 HITACHI, MEDICAL CORPORATION 发明人 MOCHITATE, MIKIO;ABE, HIROSHI;KOHNO, HIDEKI
分类号 A61B6/00;A61B6/03;A61B6/04;(IPC1-7):H05G1/06 主分类号 A61B6/00
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