发明名称 Manufacturing process for a DRAM with a buried region
摘要 A semiconductor memory cell has a semiconductor substrate, an active region disposed on the semiconductor substrate and having two impurity regions, a gate electrode disposed on the active region, a field region isolated from the active region on the semiconductor substrate and having a contract hole, a capacitor disposed over the active region and field region on the semiconductor substrate, and a buried region disposed under the field region and the bit line contacting the first impurity region through the contact hole.
申请公布号 US5830791(A) 申请公布日期 1998.11.03
申请号 US19970871779 申请日期 1997.06.09
申请人 LG SEMICON CO., LTD. 发明人 LEE, CHANG JAE;HAN, OH SEOK
分类号 H01L27/108;(IPC1-7):H01L21/824 主分类号 H01L27/108
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