发明名称 Apparatus for testing a controller with random constraints
摘要 An apparatus for testing an IDE controller with random constraints, the apparatus including: an IDE controller module for simulating the IDE controller, wherein the IDE controller includes primary and secondary channels and a host interface; a primary control module, coupled to the host interface, for testing the primary channel; a secondary control module, coupled to the host interface, for testing the secondary channel; and a host request module for arbitrating access to the host interface between the primary and secondary control modules.
申请公布号 US5832418(A) 申请公布日期 1998.11.03
申请号 US19970881716 申请日期 1997.06.23
申请人 MICRON ELECTRONICS 发明人 MEYER, JAMES W.
分类号 G06F13/00;(IPC1-7):G06F13/00 主分类号 G06F13/00
代理机构 代理人
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