发明名称 High speed device simulating method
摘要 In a method for simulating parameters including a potential in a semiconductor device, deviations of the parameters are calculated for a plurality of nodes of a mesh in the semiconductor device by Newton's method. However, when absolute values of electric fields are larger than a first value and deviations of the electric fields are larger than a second value, the parameters are renewed by adding values smaller than the deviations of the parameters thereto. Otherwise, the parameters are renewed by adding the deviations of the parameters thereto.
申请公布号 US5828586(A) 申请公布日期 1998.10.27
申请号 US19960698375 申请日期 1996.08.15
申请人 NEC CORPORATION 发明人 YOKOTA, IKUHIRO
分类号 H01L21/66;G06F17/50;H01L29/00;H01L29/78;(IPC1-7):G06F17/50 主分类号 H01L21/66
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