发明名称 Method of making NMOS and devices with sequentially formed gates having different gate lengths
摘要 A method of making NMOS and PMOS devices with different gate lengths includes providing a semiconductor substrate with first and second active regions, forming a first gate over a portion of the first active region and a second gate over a portion of the second active region, wherein the first and second gates are formed in sequence and have different lengths, and forming a source and drain in the first active region and a source and drain in the second active region. Preferably, the first gate is defined by a first photoresist layer patterned with a first exposure time, the second gate is defined by a second photoresist layer patterned with a second exposure time, and the difference in gate lengths is due primarily to a difference between the first and second exposure times.
申请公布号 US5827761(A) 申请公布日期 1998.10.27
申请号 US19970805537 申请日期 1997.02.25
申请人 ADVANCED MICRO DEVICES, INC. 发明人 FULFORD, JR., H. JIM;DAWSON, ROBERT;GARDNER, MARK I.;HAUSE, FREDERICK N.;MICHAEL, MARK W.;MOORE, BRADLEY T.;WRISTERS, DERICK J.
分类号 H01L21/8238;(IPC1-7):H01L21/823 主分类号 H01L21/8238
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