METHOD AND DEVICE FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT,申请号JP19970097599-传众专利搜索

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发明名称	METHOD AND DEVICE FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT
摘要
申请公布号	JPH10288649(A)	申请公布日期	1998.10.27
申请号	JP19970097599	申请日期	1997.04.15
申请人	YAMAHA CORP	发明人	IIDA SHUNICHI
分类号	G01R31/26;G01R31/28;(IPC1-7):G01R31/28	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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