发明名称 OPTICAL OUTPUT MEASURING METHOD FOR SEMICONDUCTOR LASER
摘要 PROBLEM TO BE SOLVED: To correctly select a kink in a simple method by limiting an incident laser to an optical reception element which is a laser only, which is distributed in a specific radiation angle within a surface at least of any surfaces including an axis of the laser emitted from semiconductor lasers. SOLUTION: A light-receiving element 5A is provided at a position separated from a laser-emitting end surface 1A of a semiconductor laser 1. The optical reception element 5A receives a laser beam in a radiating angle only which is indicated asα(about 20 deg.) in the parallel direction of a p-n junction and asγ(about 20 deg.) in the perpendicular direction. Here let a region within a radiating angleαon a parallel surface with the p-n junction of the laser be 52A and a region within a radiating angleβon a perpendicular surface be 52B. By the means an optical reception half-value angle during radiating light measurement and an incident half-value angle of the incident light to an optical fiber, when it is actually used by being installed in a device can almost be made equal and an intensity distribution change of a light within an optical reception range can be caught precisely as a variation of an optical output.
申请公布号 JPH10284780(A) 申请公布日期 1998.10.23
申请号 JP19970092105 申请日期 1997.04.10
申请人 TOSHIBA ELECTRON ENG CORP;TOSHIBA CORP 发明人 TAGAMI YUICHI
分类号 H01S5/042;(IPC1-7):H01S3/096 主分类号 H01S5/042
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