发明名称 |
OPTICAL OUTPUT MEASURING METHOD FOR SEMICONDUCTOR LASER |
摘要 |
PROBLEM TO BE SOLVED: To correctly select a kink in a simple method by limiting an incident laser to an optical reception element which is a laser only, which is distributed in a specific radiation angle within a surface at least of any surfaces including an axis of the laser emitted from semiconductor lasers. SOLUTION: A light-receiving element 5A is provided at a position separated from a laser-emitting end surface 1A of a semiconductor laser 1. The optical reception element 5A receives a laser beam in a radiating angle only which is indicated asα(about 20 deg.) in the parallel direction of a p-n junction and asγ(about 20 deg.) in the perpendicular direction. Here let a region within a radiating angleαon a parallel surface with the p-n junction of the laser be 52A and a region within a radiating angleβon a perpendicular surface be 52B. By the means an optical reception half-value angle during radiating light measurement and an incident half-value angle of the incident light to an optical fiber, when it is actually used by being installed in a device can almost be made equal and an intensity distribution change of a light within an optical reception range can be caught precisely as a variation of an optical output.
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申请公布号 |
JPH10284780(A) |
申请公布日期 |
1998.10.23 |
申请号 |
JP19970092105 |
申请日期 |
1997.04.10 |
申请人 |
TOSHIBA ELECTRON ENG CORP;TOSHIBA CORP |
发明人 |
TAGAMI YUICHI |
分类号 |
H01S5/042;(IPC1-7):H01S3/096 |
主分类号 |
H01S5/042 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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