| 摘要 |
A sense amplifier (10) for comparing the resistance of a reference cell (45) to a resistance of a data cell. The amplifier includes a first terminal for connecting the sense amplifier to the reference bit line (31) and a second terminal for connecting the sense amplifier to the data bit line (32, 33). A reference current to voltage amplifier (50) is connected to the first terminal for generating a reference voltage related to the current flowing through the reference bit line. A data current to voltage amplifier (51, 52) is connected to the second terminal for generating a data voltage related to the current flowing through the data bit line. A comparator compares the reference and data voltages. The data current to voltage amplifier includes an operational amplifier (86) for measuring the difference between a potential on a first conductor and the potential on the data bit line. |
