发明名称 APPARATUS AND METHODS FOR MEASURING GAPS WHILE COMPENSATING FOR BIREFRINGENCE EFFECTS IN THE MEASUREMENT PATH
摘要 <p>An apparatus and methods for measuring and compensating for birefringence in a rotating ground glass disk (20) such as are employed in polarization based optical flying height testers. The polarized light (1, 3) impinges on the top surface (24) of the disk (20) and is refracted through the disk to a measurement point (90) on the opposite surface (25) from which it is reflected back through the disk (20) and refracted before it exists the disk (20) in a beam (9) containing both s and p polarizations which are detected by a phase detector (13) which measures any difference in phase between the s and p polarizations. Any variation of the phase υG with respect to the position defined by the measurement point provides the birefringence parameters b∥, b for the positions on the disk (20). The phase detector (13) measure the phase υG at a skew angle z defined between the plane of incidence (101), defined by the existing beam (9) and the incident beam (3), drawn through the measurement point (90) perpendicular to a radius line (102) for the disk (20).</p>
申请公布号 WO1998046966(A1) 申请公布日期 1998.10.22
申请号 US1998006313 申请日期 1998.03.30
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