发明名称 Non-volatile semiconductor memory and method of manufacturing the same
摘要 The present invention relates to a non-volatile semiconductor memory having non-volatile memory cells capable of electrically erasing and writing data. Each memory cell has a floating gate formed on the surface of the semiconductor substrate above the channel region, and a control gate. The floating gate partially covers the channel region. Each memory cell is thereby constructed of a parallel connection of a floating gate transistor and an enhancement type transistor. The floating gate transistor is displaced in one of the widthwise directions of the channel region, or partially covers only the central portion of the channel region in the widthwise direction thereof. A plurality of memory cells are connected in series to constitute a basic block. Adjacent basic blocks are separated by an enhancement type MOS transistor. In this memory, a memory cell (floating gate) and an enhancement type MOS transistor (gate) are formed in self alignment with each other using the same mask. In addition, in this memory, a control gate and a floating gate are formed in self alignment with each other using the same mask.
申请公布号 US5824583(A) 申请公布日期 1998.10.20
申请号 US19970949819 申请日期 1997.10.14
申请人 KABUSHIKI KAISHA TOSHIBA;TOSHIBA MICRO-ELECTRONICS CORPORATION 发明人 ASANO, MASAMICHI;IWAHASHI, HIROSHI;KIRISAWA, RYOUHEI;NAKAYAMA, RYOZO;INOUE, SATOSHI;SHIROTA, RIICHIRO;ENDOH, TETSUO;MASUOKA, FUJIO
分类号 G11C16/04;H01L21/8247;H01L27/115;H01L29/788;(IPC1-7):H01L21/824 主分类号 G11C16/04
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