发明名称 Method for detecting defects in an active matrix liquid crystal display panel
摘要 Disclosed herein is a method for detecting a defect of an active matrix liquid crystal panel, the method including a step of inputting a data signal for displaying an image having a luminance level lower than a maximum luminance level to a first signal line while inputting a data signal for displaying a black image to a second signal line and a third signal line, the second signal line and the third signal line adjoining the first signal line, thereby causing pixels corresponding to the first signal line to display a single color. According to the method of the present invention, any defective pixel is displayed darker than normal, owing to a decrease in the transmittance, so that point defects such as S-D leak defects can be easily detected.
申请公布号 US5825196(A) 申请公布日期 1998.10.20
申请号 US19960739760 申请日期 1996.10.29
申请人 SHARP KABUSHIKI KAISHA 发明人 IRIE, KATSUMI;KAWASE, NOBUYUKI;HAYAMA, TAKAFUMI;KASAHARA, TOUKO
分类号 G01R31/00;G02F1/13;G02F1/136;G02F1/1368;G09G3/00;G09G3/36;H01L29/786;(IPC1-7):G01R31/00 主分类号 G01R31/00
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