发明名称 Calibration system and method for x-ray geometry
摘要 A system for X-ray geometry calibration comprises a calibration frame adapted for mounting proximate to at least a portion of a patient's body, such as a patient's head. An X-ray source cooperates with a target at a given orientation and distance from the portion of a patient's body for forming an image of the portion of a patient's body and of at least an associated portion of the calibration frame. The calibration frame includes encoding arrangement for uniquely determining correspondence between the image of the associated portion of the calibration frame and the calibration frame such that the orientation and distance can be determined uniquely from the image of the associated portion of the calibration frame.
申请公布号 US5822396(A) 申请公布日期 1998.10.13
申请号 US19970893283 申请日期 1997.07.15
申请人 SIEMENS CORPORATE RESEARCH, INC. 发明人 NAVAB, NASSIR;BANI-HASHEMI, ALI REZA
分类号 A61B6/00;(IPC1-7):G01D18/00 主分类号 A61B6/00
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