发明名称 NON-VOLATILE SEMICONDUCTOR MEMORY
摘要 <p>PROBLEM TO BE SOLVED: To prevent the occurrence of wiring erroneously in a memory cell in which '1' is written when changing voltage of a channel is low. SOLUTION: A source line bias circuit 9 is connected to source lines of memory cell arrays 1A, 1B. After the source line bias circuit 9 pre-charges channel voltage of a memory cell more highly than power source voltage by supplying voltage being higher than power source voltage and lower than erasing voltage to a source line at the time of writing data, the circuit 9 boosts the voltage by capacity coupling with a control gate, thereby preventing erroneous writing in a memory cell to which '1' is written.</p>
申请公布号 JPH10275481(A) 申请公布日期 1998.10.13
申请号 JP19980014249 申请日期 1998.01.27
申请人 TOSHIBA CORP 发明人 TAKEUCHI TAKESHI
分类号 G11C16/02;(IPC1-7):G11C16/02 主分类号 G11C16/02
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