发明名称 Circuit for generating internal column address suitable for burst mode
摘要 An internal column address generation circuit generates an internal column address by utilizing an asynchronous counter. The circuit includes a column address buffer for synchronizing an initially received external address with an external system clock to generate the internal column address, and for synchronizing a counting bit output signal received at an internal input node with the external system clock to generate the internal column address; and an asynchronous counter connected to an output node of the column address buffer, for generating the bit output signal having the same or opposite phase as/to a phase of the internal column address received from the column address buffer, in response to a carry generation state.
申请公布号 US5822270(A) 申请公布日期 1998.10.13
申请号 US19960769434 申请日期 1996.12.19
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, CHUROO
分类号 G11C11/408;G11C7/10;G11C11/407;(IPC1-7):G11C8/00 主分类号 G11C11/408
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